V62/04730-01XE Texas Instruments · 64-TSSOP (DGG)

Name: V62/04730-01XE Texas Instruments
Brand: Texas Instruments
SKU: V62/04730-01XE

Enhanced Product 3.3-V Abt Scan Test Devices With 18-Bit Universal Bus Transceivers

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Stock, lead time and price for V62/04730-01XE by Texas Instruments are checked on request; ONE BOM LIMITED replies within one business day.

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Updated Sep 17, 2026

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Quality process, mapped to industry standards

Source verification — supplier credentials, lot origin declaration, authorized-chain records (AS6081)

Incoming visual inspection — markings, coplanarity, oxidation, refurbishment signs (IDEA-STD-1010-B)

X-ray — die, bond wires and voids compared with a golden sample (AS6171/4)

Decap / solvent test — sample decapsulation for die marking; acetone marking test (IDEA-STD-1010-B)

Functional / electrical test — key parameters on bench or at a third-party lab (AS6171/6)

Moisture & packaging — MSL level, vacuum bag, desiccant, humidity indicator (JEDEC J-STD-020 / J-STD-033)

Shipment report — inspection photos and report number with every lot (ISO 9001:2015)

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